A robust data simulation technique to improve early detection performance of a classifier in control chart pattern recognition systems

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Özet

The quality control process is essential in maintaining the stability of production systems and proactively detecting abnormalities that may result in high mechanical and labor costs. In this study, a new data simulation strategy was devised to improve the early prediction performance (EPP) of an algorithm. Traditional control chart data simulation methods work based on creating abnormal patterns consisting of only abnormal signals. However, a classifier trained with data samples consisting of only abnormal data signals may fail to early detect abnormality in a real-time production line, in which abnormal signals is obscured by volume of normal signals. From this perspective, training a model by imitating real-world cases can improve the performance of an algorithm in terms of early detection of an abnormality. Normal and abnormal patterns were simulated by implementing a new approach called Mix Ratio Data Simulation (MRDS). The proposed methodology MRDS is compared with the customary data simulation method under the predefined scenarios in terms of EPP. The findings indicated that changing the way of simulating dataset increases the EEP of the machine-learning algorithm regardless of abnormality types and parameters.

Anahtar Kelimeler

RDL Kalıcı Bağlantı (PID)
https://rdlopen.rawdatalibrary.net/r/gumushane/12606Resmi atıflarda kullanılan kalıcı adres
DOI
https://doi.org/10.1016/j.ins.2020.09.059Yayıncı resmi DOI adresi
Tam Kayıt
AlanDeğerDil
dc.contributor.authorÜnlü, Ramazan
dc.date.accessioned2026-10-22T10:20:19.507834480Z
dc.date.available2026-10-22T10:20:19.507834480Z
dc.date.issued2021
dc.description.abstractThe quality control process is essential in maintaining the stability of production systems and proactively detecting abnormalities that may result in high mechanical and labor costs. In this study, a new data simulation strategy was devised to improve the early prediction performance (EPP) of an algorithm. Traditional control chart data simulation methods work based on creating abnormal patterns consisting of only abnormal signals. However, a classifier trained with data samples consisting of only abnormal data signals may fail to early detect abnormality in a real-time production line, in which abnormal signals is obscured by volume of normal signals. From this perspective, training a model by imitating real-world cases can improve the performance of an algorithm in terms of early detection of an abnormality. Normal and abnormal patterns were simulated by implementing a new approach called Mix Ratio Data Simulation (MRDS). The proposed methodology MRDS is compared with the customary data simulation method under the predefined scenarios in terms of EPP. The findings indicated that changing the way of simulating dataset increases the EEP of the machine-learning algorithm regardless of abnormality types and parameters.
dc.identifier.doi10.1016/j.ins.2020.09.059
dc.identifier.eissn1872-6291
dc.identifier.endpage36
dc.identifier.issn0020-0255
dc.identifier.scopus2-s2.0-85092693028
dc.identifier.startpage18
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/gumushane/12606
dc.identifier.volume548
dc.identifier.wosWOS:000596057300002
dc.language.isoen
dc.publisherElsevier Inc.
dc.relation.ispartofInformation Sciences
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectCCP Data Simulation
dc.subjectControl Chart Pattern Recognition
dc.subjectEarly Prediction Performance
dc.subject.classificationComputer Science, Information Systems
dc.subject.classificationComputer Science
dc.subject.otherControl charts
dc.subject.otherFlowcharting
dc.subject.otherLearning algorithms
dc.subject.otherMachine learning
dc.subject.otherQuality control
dc.subject.otherWages
dc.subject.otherAbnormal data
dc.subject.otherAbnormal patterns
dc.subject.otherData simulation
dc.subject.otherDetection performance
dc.subject.otherEarly prediction
dc.subject.otherNew approaches
dc.subject.otherProduction system
dc.subject.otherReal-time production
dc.subject.otherPattern recognition systems
dc.titleA robust data simulation technique to improve early detection performance of a classifier in control chart pattern recognition systems
dc.typeArticle
dspace.entity.typePublication
rdl.citation.openalex17
rdl.citation.scopus18
rdl.citation.wos14
rdl.oa.statusclosed
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)