Cost-oriented LSTM methods for possible expansion of control charting signals

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Özet

Manual quality control may result in delayed detection of a system defect, or none at all, potentially resulting in malfunctions that can lead to disruption of the system, incur extra costs, or complete downtime of the system. To mitigate such issues, more advanced statistics and machine learning-based systems such as SVM, WSVM, etc. are used to automatically detect error signals during the process. However, these methodologies are not developed for sequential dataset such as a classical CCPR dataset. As a result, in this study, we have implemented a preliminary Cost-Oriented Long-Short Term Memory (LSTM), which is designed to learn from a sequential dataset and compare it with SVM and WSVM which are traditional methods utilized in the field. Additionally, we compared the performance of methods in terms of early detection of an abnormal pattern. Based on the findings, the Cost-Oriented LSTM method outperforms SVM and WSVM in the majority of abnormal patterns in terms of both classification and early detection performance. Global accuracy score which is the average of accuracy rates in all combination of abnormal parameters and window lengths shows that LSTM gives a better accuracy score than SVM and WSVM in all seven abnormal patterns detection.

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https://rdlopen.rawdatalibrary.net/r/gumushane/11670Resmi atıflarda kullanılan kalıcı adres
DOI
https://doi.org/10.1016/j.cie.2021.107163Yayıncı resmi DOI adresi
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Scopus
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WoS
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OpenAlex
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dc.contributor.authorÜnlü, Ramazan
dc.date.accessioned2026-10-22T10:19:15.037734319Z
dc.date.available2026-10-22T10:19:15.037734319Z
dc.date.issued2021
dc.description.abstractManual quality control may result in delayed detection of a system defect, or none at all, potentially resulting in malfunctions that can lead to disruption of the system, incur extra costs, or complete downtime of the system. To mitigate such issues, more advanced statistics and machine learning-based systems such as SVM, WSVM, etc. are used to automatically detect error signals during the process. However, these methodologies are not developed for sequential dataset such as a classical CCPR dataset. As a result, in this study, we have implemented a preliminary Cost-Oriented Long-Short Term Memory (LSTM), which is designed to learn from a sequential dataset and compare it with SVM and WSVM which are traditional methods utilized in the field. Additionally, we compared the performance of methods in terms of early detection of an abnormal pattern. Based on the findings, the Cost-Oriented LSTM method outperforms SVM and WSVM in the majority of abnormal patterns in terms of both classification and early detection performance. Global accuracy score which is the average of accuracy rates in all combination of abnormal parameters and window lengths shows that LSTM gives a better accuracy score than SVM and WSVM in all seven abnormal patterns detection.
dc.identifier.articlenumber107163
dc.identifier.doi10.1016/j.cie.2021.107163
dc.identifier.eissn1879-0550
dc.identifier.issn0360-8352
dc.identifier.scopus2-s2.0-85100643964
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/gumushane/11670
dc.identifier.volume154
dc.identifier.wosWOS:000632964300047
dc.language.isoen
dc.publisherElsevier Ltd
dc.relation.ispartofComputers and Industrial Engineering
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectControl Charts
dc.subjectLSTM
dc.subjectPattern Recognition
dc.subjectSVM
dc.subjectWSVM
dc.subject.classificationComputer Science, Interdisciplinary Applications
dc.subject.classificationEngineering, Industrial
dc.subject.classificationComputer Science
dc.subject.classificationEngineering
dc.subject.otherChemical detection
dc.subject.otherControl charts
dc.subject.otherError statistics
dc.subject.otherPattern recognition
dc.subject.otherQuality control
dc.subject.otherSupport vector machines
dc.subject.otherAbnormal patterns
dc.subject.otherAccuracy rate
dc.subject.otherControl charting
dc.subject.otherDetection performance
dc.subject.otherError signal
dc.subject.otherSystem defects
dc.subject.otherLong short-term memory
dc.titleCost-oriented LSTM methods for possible expansion of control charting signals
dc.typeArticle
dspace.entity.typePublication
rdl.citation.openalex22
rdl.citation.scopus22
rdl.citation.wos19
rdl.oa.statusclosed
rdl.scopus.quartileQ1
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)