Dead Time Correction at X and Gamma-Rays Detectors - Part 1- Integral Correction

Determination of and compensating for count losses for the correctness of analyses in spectrometric analysis of qualitative and quantitative use of semiconductor detectors are of importance. These counting losses in spectrometry are due to the pulse pile-up, paralyzable and non-paralyzable system dead time or dual and triple combination of these three mechanisms. In this work, a new method is suggested for compensate for counting losses resulting from abovementioned three factors. For this purpose, a source code was developed. A number of experimental studies were performed to test the proposed method. As a result, it was seen to provide an effective correction of proposed method at low-and middle-grade counting rates.